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AENOR Norma
UNE 20607:1980

UNE 20607:1980

Planes de muestreo para determinar la tasa de fallos de los componentes electrónicos de fiabilidad establecida.

FAILURE RATE SAMPLING PLANS AND PROCEDURES

Publication date:
1980-12-15 /Cancelled
Cancellation date:
2013-01-24
Version confirmed on:
2000-12-01
60
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